Mentor Graphics: Digital – Design-For-Test (DFT)

TestKompress
Embedded deterministic test tool, proven to provide up to 100X compression for improved test quality and cost.

FastScan
ATPG tool featuring at-speed test, diagnostics, and MacroTest for testing small, embedded blocks.

DFTAdvisor
Testability analysis and test synthesis tool.

FlexTest
Fault simulation tool for functional vectors and ATPG for unstructured designs.

MBISTArchitect
A comprehensive memory BIST generation tool, offering true at-speed application and BIST insertion, along with diagnostics and repair capabilities.

MacroTest
A scan-based approach for non-intrusively testing small, embedded memory arrays.

BSDArchitect
Boundary scan generation tool for automating IEEE 1149.1 circuitry for board test and on-chip test control.

LBISTArchitect
A complete environment for all aspects of logic BIST design, including at-speed testing and diagnostics.

YieldAssist
Accurately identifies yield limiting defects and locates those defects in the physical layout

Calibre YieldAnalyzer
Integrated suite of analysis tools to reduce variability in design-related yield loss

Calibre YieldEnhancer
Layout modification platform to automate design yield enhancement

** For more info, please visit www.mentor.com

Back